Our Research Program |
Below are some
of the research areas we're working on now.
![]() If you'd like to find out more on any of these topics, please email me: kuhn@nist.gov. Covering array algorithms - better algorithms to produce 2-way through 6-way arrays. These include:
Fault localization
- When combinatorial tests are run, some may detect faults in the
application under test, but which particular combination of parameters
is responsible for triggering the fault?
Distribution of interaction faults - What proportion of faults observed in real-world software are caused by a single parameter, 2-way interactions, 3-way interactions, etc.? So far, data that we have been able to obtain suggest that the overwhelming majority of faults are caused by interactions of three or fewer parameter values, with a rapidly decreasing percentage involving 4-way to 6-way interactions. Integration into the development process - Tools and methods to integrate combinatorial testing into industrial software development, including methods to deal with the oracle problem and tools to link the input and output of our covering array generator with other software tools. Application to modeling and simulation - combinatorial methods have potential for increasing the efficiency of simulations, detecting errors, and for analysis of simulation results. People We have friendly, formal and informal collaborations with an ever-growing number of researchers Rick Kuhn and Raghu Kacker are NIST PIs. Renee Bryce - Utah State Jim Lawrence - George Mason University and NIST Faculty Associate Jeff (Yu) Lei - University of Texas Arlington and NIST Guest Researcher Sreedevi Sampath - University of Maryland Baltimore County Tao Xie - North Carolina State University |